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ARL—3520AES电感耦合等离子体发射光谱仪疑难故障的分析与排除
方跃平,徐盈
1996
Source Publication分析测试技术与仪器
Issue1
Abstract介绍了在瑞士ARL公司生产的ICP—3520AES型电感耦合等离子体原子发射光谱仪上存在的一种疑难故障的分析与排除过程,对同类型仪器的故障分析有借鉴作用.
KeywordIcp-aes,故障,微处理器,信号
Department中国科学院水生生物研究所
Indexed ByCSCD
Language中文
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Document Type期刊论文
Identifierhttp://ir.ihb.ac.cn/handle/152342/4592
Collection期刊论文
Recommended Citation
GB/T 7714
方跃平,徐盈. ARL—3520AES电感耦合等离子体发射光谱仪疑难故障的分析与排除[J]. 分析测试技术与仪器,1996(1).
APA 方跃平,徐盈.(1996).ARL—3520AES电感耦合等离子体发射光谱仪疑难故障的分析与排除.分析测试技术与仪器(1).
MLA 方跃平,徐盈."ARL—3520AES电感耦合等离子体发射光谱仪疑难故障的分析与排除".分析测试技术与仪器 .1(1996).
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